Title :
Polarization properties of a fiber to planar waveguide coupler incorporating a thin metal layer
Author :
Kutsaenko, V. ; Johnstone, W. ; Lavretskii, E. ; Rice, J.
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci., Moscow, Russia
Abstract :
A fiber to planar waveguide coupling structure incorporating a thin metal layer is described. The resonant wavelengths for the TM polarization were found to be highly sensitive to the refractive index of the superstrate material while those for the TE polarization were unaffected. A theoretical model for the multilayer structure was developed on the basis of a matrix method approach and a preliminary analysis of the resonance shift phenomena for the TM mode shows good agreement with experiment.<>
Keywords :
light polarisation; metallic thin films; optical communication equipment; optical fibre communication; optical fibre couplers; optical planar waveguides; refractive index; TE polarization; TM mode; TM polarization; fiber to planar waveguide coupler; highly sensitive; matrix method; multilayer structure; planar waveguide coupling structure; polarization properties; refractive index; resonance shift phenomena; resonant wavelengths; superstrate material; thin metal layer; Optical fiber couplers; Optical fiber devices; Optical fiber polarization; Optical films; Optical planar waveguides; Optical surface waves; Optical waveguides; Planar waveguides; Resonance; Tellurium;
Journal_Title :
Photonics Technology Letters, IEEE
