Title :
Magnetic field sensitivity of variable thickness microbridges in TBCCO, BSCCO, and YBCO
Author :
Davidson, B.A. ; Redwing, R.D. ; O´Callaghan, James ; Raissi, Farshid ; Ji Ung Lee ; Burke, J.P. ; Hohenwarter, G.K.G. ; Nordman, J.E. ; Beyer, J.B. ; Liou, S.H. ; Eckstein, Johannes ; Siegal, M.P. ; Hou, S.Y. ; Phillips, Jeff M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
We describe results of a study comparing the magnetic field sensitivities of variable thickness bridge (VTB) arrays fabricated in TBCCO, BSCCO, and YBCO thin films. Identical structures were patterned in a variety of films, and the bridges were thinned by four different methods. Analysis of the data yields experimental evidence as to the suitability of these types of films for devices such as the superconducting flux flow transistor (SFFT) which is based on this geometry. The volt-ampere characteristics of the arrays were measured in low uniform magnetic fields (/spl les/130 G) and in nonuniform fields (/spl les/5 G) produced by a nearby control line. For these films in this geometry, no measurable effect of the control line magnetic field was observed. Large values of transresistance and current gain could only be attained through a thermal mechanism when the control line was driven normal. Upper bounds for (magnetically generated) transresistance (/spl les/5 m/spl Omega/) and current gains (/spl les/0.005) have been inferred from the uniform field data assuming a standard best-case device geometry. All volt-ampere curves followed closely a power law relationship (V/spl sim/I/sup n/), with exponent n /spl sim/1.2-10. We suggest materials considerations that may yield improved device performance.<>
Keywords :
electric current; electric resistance; high-temperature superconductors; magnetic fields; sensitivity; superconducting thin films; 130 G; 5 G; 5 mohmm; BSCCO; BiSrCaCuO; TBCCO; TlBaCaCuO; YBCO; YBaCuO; control line; control line magnetic field; current gain; current gains; low uniform magnetic fields; magnetic field sensitivities; magnetic field sensitivity; magnetically generated transresistance; nonuniform fields; superconducting flux flow transistor; superconducting thin films; thermal mechanism; thin films; transresistance; variable thickness bridge; variable thickness microbridges; volt-ampere characteristics; Bismuth compounds; Bridge circuits; Data analysis; Geometry; Magnetic field measurement; Magnetic fields; Magnetic films; Superconducting films; Superconducting thin films; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on