The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

Author

Ten Haken, B. ; van de Klundert, L.J.M. ; Vysotsky, V.S. ; Karasik, V.R.

Author_Institution

Appl. Superconductivity Center, Twente Univ., Enschede, Netherlands

Volume

28

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

755

Lastpage

758

Abstract

With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape

Keywords

critical currents; electric current measurement; niobium alloys; superconducting devices; titanium alloys; type II superconductors; 20 micron; NbTi tape; critical current; current reduction; magnetic field; one-dimensional model; self field; superconducting thermal switch; Conducting materials; Conductors; Critical current; Current measurement; Magnetic field measurement; Niobium compounds; Superconducting films; Superconducting materials; Switches; Titanium compounds;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.119989

Filename

119989