DocumentCode
1203804
Title
Numerical modeling and electromagnetic resonant modes in complex grating structures and optoelectronic device applications
Author
Crouse, David
Author_Institution
Dept. of Electr. Eng., City Coll. of New York, NY, USA
Volume
52
Issue
11
fYear
2005
Firstpage
2365
Lastpage
2373
Abstract
An extended surface impedance boundary condition algorithm is developed that allows for the optical properties of a wide variety of complex one-dimensional periodic grating structures to be modeled. Wood-Rayleigh anomalies, diffraction, and electromagnetic resonance modes including horizontally oriented surface plasmons and vertical surface resonances are identified and described as well as analyzing their structural and geometrical dependencies. Methods to combine these modes to produce hybrid modes that channel and localize light are described. Application of these modes to metal-semiconductor-metal photodetectors (MSM-PD) is discussed and an example silicon-based MSM-PD with over 30 GHz bandwidth and 0.3 A/W responsivity is described.
Keywords
diffraction gratings; light diffraction; periodic structures; photodetectors; semiconductor-metal boundaries; surface electromagnetic waves; surface impedance; surface plasmon resonance; Wood-Rayleigh anomalies; complex grating structures; complex one-dimensional periodic grating structures; electromagnetic resonance modes; electromagnetic resonant modes; extended surface impedance boundary condition algorithm; metal-semiconductor-metal photodetectors; optical properties; optoelectronic device applications; semiconductor-metal interfaces; surface plasmons; surface waves; vertical surface resonances; Boundary conditions; Electromagnetic devices; Electromagnetic modeling; Geometrical optics; Gratings; Numerical models; Optoelectronic devices; Periodic structures; Resonance; Surface impedance; Diffraction; metal–semiconductor–metal (MSM) devices; optoelectronic devices; photodetectors; plasmons; semiconductor–metal interfaces; surface plasmon (SP); surface waves;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2005.857172
Filename
1522671
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