DocumentCode :
1203851
Title :
Failure of moments-based transport models in nanoscale devices near equilibrium
Author :
Jungemann, Christoph ; Grasser, Tibor ; Neinhuus, Burkhard ; Meinerzhagen, Bernd
Author_Institution :
Inst. for Electron Devices & Circuits, Tech. Univ. Braunschweig, Germany
Volume :
52
Issue :
11
fYear :
2005
Firstpage :
2404
Lastpage :
2408
Abstract :
It is shown that the conductance in nanoscale devices near equilibrium strongly depends on the choice of the transport model. Errors larger than a factor of two can be encountered, if the drift-diffusion (DD) model is used instead of a model based on the full Boltzmann equation. This effect is due to a fundamental difference in carrier heating between bulk systems and devices. Although carrier heating is included in hydrodynamic models, this effect is captured only partially by these models due to the model inherent approximations. A direct consequence of the failure of the DD approximation is that the usual method for inversion layer mobility extraction from measurements in the linear regime becomes inaccurate for short gate lengths and the extracted mobilities might be too small. This error has also an impact on the modeling accuracy at strong nonequilibrium. In the case of the DD model, the overestimation of the conductivity in the linear regime can partly compensate the underestimation of the current at high bias, and the model accidentally appears to be more accurate than expected.
Keywords :
Boltzmann equation; carrier mobility; nanoelectronics; semiconductor device models; Boltzmann equations; carrier heating; drift-diffusion model; hydrodynamic models; inversion layer mobility extraction; moments-based transport models; nanoscale devices; Boltzmann equation; Current density; Electrons; Heating; High definition video; Hydrodynamics; Length measurement; Microscopy; Nanoscale devices; Particle scattering; Boltzmann equation (BE); drift-diffusion (DD); equilibrium; hydrodynamic; small-signal;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.857184
Filename :
1522676
Link To Document :
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