Title :
Measurement of eye diagrams and constellation diagrams of optical sources using linear optics and waveguide technology
Author :
Dorrer, C. ; Doerr, C.R. ; Kang, I. ; Ryf, R. ; Leuthold, J. ; Winzer, P.J.
Author_Institution :
Lucent Technol., Bell Labs., Holmdel, NJ, USA
Abstract :
We demonstrate the characterization of optical sources with high sensitivity, high temporal resolution, and phase sensitivity using linear optical sampling. Eye diagrams and constellation diagrams are reconstructed using the interference of the source under test with a train of sampling pulses. This concept is implemented using a waveguide optical hybrid, which splits and recombines the sources and adjusts the phase between the recombined signals to provide optimal detection. This diagnostic is used to characterize on-off keyed (OOK) waveforms at rates up to 640 Gb/s and various phase-shift keyed (PSK) signals at 10 and 40 Gb/s.
Keywords :
amplitude shift keying; integrated optics; light interference; light sources; optical fibre communication; optical waveguides; phase shift keying; 10 Gbit/s; 40 Gbit/s; 640 Gbit/s; constellation diagrams; diagram reconstruction; eye diagrams; high temporal resolution; linear optical sampling; linear optics; on-off keyed waveforms; optical sources; optimal detection; phase sensitivity; phase-shift keyed signals; sampling pulses; waveguide optical hybrid; waveguide technology; Constellation diagram; Fiber nonlinear optics; Nonlinear optics; Optical mixing; Optical pulses; Optical sensors; Optical waveguides; Phase shift keying; Sampling methods; Ultrafast optics; Linear optical sampling; optical communications; optical planar waveguide components; phase measurement; phase shift keying; sampling methods;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.840359
