DocumentCode :
1204182
Title :
Development of an alternative wire bond test technique
Author :
Pecht, Michael ; Barker, Donald ; Lall, Pradeep
Author_Institution :
CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
Volume :
17
Issue :
4
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
610
Lastpage :
615
Abstract :
An alternative test technique to the wire bond pull test is presented for wire bond interconnects. The new test technique, based on electromagnetic resonance, has the potential for on-line use as a quality assurance and operational life evaluation method. The new technique greatly reduces the test time in comparison with the existing MIL-STD-883 pull test and internal visual inspection. This new test technique more closely simulates the operational stress than the wire bond pull test and has also shown a sensitivity to defects that would otherwise escape visual inspection
Keywords :
integrated circuit interconnections; integrated circuit testing; lead bonding; life testing; quality control; defects; electromagnetic resonance; on-line use; operational life evaluation; operational stress; quality assurance; simulation; test technique; wire bond interconnects; Bonding forces; Inspection; Life testing; Modems; Nondestructive testing; Quality assurance; Resonance; Stress; Ultra large scale integration; Wire;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.335048
Filename :
335048
Link To Document :
بازگشت