DocumentCode :
1204202
Title :
A practical excimer laser-based cleaning tool for removal of surface contaminants
Author :
Park, Hee K. ; Grigoropoulos, Costas P. ; Leung, Wing P. ; Tam, Andrew C.
Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
Volume :
17
Issue :
4
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
631
Lastpage :
643
Abstract :
A laser-cleaning tool capable of removing surface contaminants such as submicron-sized particulates and organic films has been constructed and implemented in practical use. An industrial-grade KrF excimer laser is utilized to irradiate the solid surface to be cleaned. The nanosecond-pulsed laser irradiation, shortly after the deposition of a thin liquid film on the surface, induces explosive vaporization of the liquid and removal of particulates (“steam cleaning”). The ultraviolet (UV) irradiation also causes ablative photodecomposition of organic film contaminants on the surface (“dry cleaning”). Hence, cleaning can best be done with the combination of these two laser-cleaning modes. The excimer laser cleaning tool is constructed with an aim toward practical use: It includes a computer-controlled laser beam scanning system and a stable liquid film deposition unit, providing a cleaning rate of over 200 cm /min. Semiconductor, metal, and ceramic sample surfaces, contaminated with 1-μm sized alumina particles and micron-thick epoxy films, are tested by laser cleaning. The effectiveness of laser cleaning is compared with ultrasonic technique. The cleaning strategy and the probability of thermal damage due to laser cleaning are discussed
Keywords :
excimer lasers; laser materials processing; surface cleaning; surface contamination; 1 micron; KrF; ablative photodecomposition; alumina particles; ceramic; computer-controlled laser beam scanning system; dry cleaning; epoxy films; explosive vaporization; industrial-grade KrF excimer laser; laser-cleaning tool; liquid film deposition; metal; nanosecond-pulsed laser irradiation; organic films; semiconductor; steam cleaning; submicron-sized particulates; surface contaminants; thermal damage; ultraviolet irradiation; Cleaning; Explosives; Laser beams; Laser modes; Laser stability; Semiconductor films; Semiconductor lasers; Solid lasers; Surface contamination; Surface emitting lasers;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.335050
Filename :
335050
Link To Document :
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