Title :
An Automated Test System for MNOS Transistor Characterization
Author :
Kwan, Sze-Hon ; Cham, Kit M. ; Wegener, H.A.Richard
Abstract :
An automated and thorough characterization of MNOS transistors has been made possible by using a calculator-based instrumentation system. Fast pulse techniques are used to obtain maximum information and minimize reading disturbance during measurements. Device characteristics such as retention, endurance, and mobility can be obtained with minimal manual interaction.
Keywords :
Automatic testing; Circuit testing; Electrodes; Integrated circuit measurements; MOSFETs; Pulse measurements; Silicon; System testing; Threshold voltage; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1983.4315119
