• DocumentCode
    1204580
  • Title

    A Sensitive AC System for Measuring Changes in Small Hall Voltages at High Temperatures

  • Author

    Rowe, David Michael ; Shukla, Vishnu Shankar

  • Volume
    33
  • Issue
    1
  • fYear
    1984
  • fDate
    3/1/1984 12:00:00 AM
  • Firstpage
    19
  • Lastpage
    21
  • Abstract
    A simple ac sysyem which incorprates a phase-sensitive detector for measuring changes in small Hall voltages at high temperatures is described. Under optimum operating conditions, the system has a sensitivity of better than 10-8 V. The apparatus has been used to directly investigate the change of charge carrier concentration with time in very heavily doped semiconductor material while undergoing high-temperature isothermal heat treatment.1 A chart recording of a < 10-7-V change in Hall voltage at a temperature of 1040 K is given as an indication of the system´s performance. The results of Hall-voltage measurements on zone levelled n-type Si63.5 Ge36.5 alloy doped with phosphorus to ~1.2 X 1026 m-3 over a range of heat-treatment temperatures and as a function of time are reported. The results indicate that over a certain temperature range, precipitation of phosphorus takes place very rapidly and the rate of change of carrier concentration exhibits a maximum in the temperature range around 750 K.
  • Keywords
    Charge carriers; Detectors; Heat treatment; Isothermal processes; Phase detection; Phase measurement; Semiconductor materials; Temperature distribution; Temperature sensors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1984.4315144
  • Filename
    4315144