Title :
New technique for measuring the scattering coefficients of two-port devices
Author :
Yeo, S.P. ; Cheng, Ming
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore
fDate :
11/10/1994 12:00:00 AM
Abstract :
A new technique (based on a extension of the six-port reflectometer procedure) is used to measure the scattering coefficients of two-port devices. Only six power sensors are required, as opposed to a total of eight for the dual-reflectometer scheme. Tests confirm that the nine-port instrument based on this technique is able to yield reasonably good measurement accuracies
Keywords :
S-parameters; measurement errors; reflectometers; two-port networks; measurement accuracies; nine-port instrument; power sensors; scattering coefficients; six-port reflectometer; two-port devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941333
