DocumentCode
1205418
Title
Dielectric Thickness Measurement Employing Heterodyne Technique
Author
Saadallah, S. ; Allos, J.E. ; Daher, R.H.
Issue
1
fYear
1985
fDate
3/1/1985 12:00:00 AM
Firstpage
17
Lastpage
21
Abstract
A microwave system for measuring the thickness of dielectric materials employing the heterodyne technique is described. Calibration curves relating the dc output voltage and dielectric thickness are presented for leather, glass, and cartons. The system was operated at 9 GHz. The experimental results illustrate the suitability of the technique for industrial applications.
Keywords
Dielectric materials; Dielectric measurements; Frequency conversion; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Phase measurement; Reactive power; Thickness measurement; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1985.4315248
Filename
4315248
Link To Document