Title :
High Precision Measurements of the Quantized Hall Resistance at the PTB
Author :
Bliek, Leendert ; Braun, Erich ; Melchert, F. ; Warnecke, Peter ; Schlapp, W. ; Weimann, G. ; Ploog, Klaus ; Ebert, Gunther ; Dorda, Gerhard E.
fDate :
6/1/1985 12:00:00 AM
Abstract :
Quantized Hall resistances in GaAs-GaAlAs heterostructures and Si MOSFET´s have been investigated. The influence of the sample temperature, the step number, and the material was found to be less than 3 parts in 108.
Keywords :
Circuits; Conducting materials; Electrical resistance measurement; Magnetic field measurement; Magnetic fields; Magnetic materials; Measurement standards; Resistors; Temperature; Voltmeters;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1985.4315330
