• DocumentCode
    1206172
  • Title

    High Precision Measurements of the Quantized Hall Resistance at the PTB

  • Author

    Bliek, Leendert ; Braun, Erich ; Melchert, F. ; Warnecke, Peter ; Schlapp, W. ; Weimann, G. ; Ploog, Klaus ; Ebert, Gunther ; Dorda, Gerhard E.

  • Issue
    2
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    304
  • Lastpage
    305
  • Abstract
    Quantized Hall resistances in GaAs-GaAlAs heterostructures and Si MOSFET´s have been investigated. The influence of the sample temperature, the step number, and the material was found to be less than 3 parts in 108.
  • Keywords
    Circuits; Conducting materials; Electrical resistance measurement; Magnetic field measurement; Magnetic fields; Magnetic materials; Measurement standards; Resistors; Temperature; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1985.4315330
  • Filename
    4315330