DocumentCode
1206557
Title
Measurement Technique of Low-Level and Low-Frequency Conductivity Fluctuations
Author
Franceschini, Giovanni ; Marioli, Daniele
Issue
3
fYear
1985
Firstpage
466
Lastpage
468
Abstract
In this paper the authors analyze a technique to measure both low-level and low-frequency conductivity fluctuations in noisy environments. This technique is based on a "lock-in detection" circuit with a feedback loop, containing an integrator and a modulator, to obtain a good signal-to-noise ratio and high sensitivity. Fluctuation frequency components lower than 0.01 Hz with sensitivity of 1 V per 100 ppm of mean value variation are achieved with an instrument based on this method.
Keywords
Circuit noise; Conductivity measurement; Feedback circuits; Feedback loop; Fluctuations; Integrated circuit measurements; Low-frequency noise; Measurement techniques; Signal to noise ratio; Working environment noise;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1985.4315372
Filename
4315372
Link To Document