DocumentCode :
1206557
Title :
Measurement Technique of Low-Level and Low-Frequency Conductivity Fluctuations
Author :
Franceschini, Giovanni ; Marioli, Daniele
Issue :
3
fYear :
1985
Firstpage :
466
Lastpage :
468
Abstract :
In this paper the authors analyze a technique to measure both low-level and low-frequency conductivity fluctuations in noisy environments. This technique is based on a "lock-in detection" circuit with a feedback loop, containing an integrator and a modulator, to obtain a good signal-to-noise ratio and high sensitivity. Fluctuation frequency components lower than 0.01 Hz with sensitivity of 1 V per 100 ppm of mean value variation are achieved with an instrument based on this method.
Keywords :
Circuit noise; Conductivity measurement; Feedback circuits; Feedback loop; Fluctuations; Integrated circuit measurements; Low-frequency noise; Measurement techniques; Signal to noise ratio; Working environment noise;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1985.4315372
Filename :
4315372
Link To Document :
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