DocumentCode :
1206822
Title :
In Situ Emission Microscopy of Scandium/Scandium-Oxide and Barium/Barium-Oxide Thin Films on Tungsten
Author :
Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.
Author_Institution :
Ohio Univ., Athens, OH
Volume :
56
Issue :
5
fYear :
2009
fDate :
5/1/2009 12:00:00 AM
Firstpage :
794
Lastpage :
798
Abstract :
The effect of a thin Sc/Sc-oxide base layer on Ba/Ba-oxide electron emission, surface diffusion, adsorption, and desorption on W is studied using photoelectron emission microscopy and thermionic emission microscopy. A barium-on-scandium structure enhances both photo- and thermionic electron emission.
Keywords :
adsorption; barium; barium compounds; desorption; electron emission; optical microscopy; photoelectron microscopy; scandium; scandium compounds; surface diffusion; thermionic electron emission; thin films; Ba-BaO; Sc-ScO; W; adsorption; barium-on-scandium structure; desorption; oxide base layer; oxide electron emission; photoelectron emission; photoelectron emission microscopy; surface diffusion; thermionic emission microscopy; Barium; Cathodes; Electron emission; Heating; Kinetic energy; Photoelectron microscopy; Scanning electron microscopy; Temperature; Thermionic emission; Tungsten; Photoelectron emission microscopy (PEEM); scandate cathode; thermionic cathode; thermionic emission microscopy (ThEEM);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2015410
Filename :
4806053
Link To Document :
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