DocumentCode :
1207070
Title :
Active Control of Microinterferometers for Low-Noise Parallel Operation
Author :
Karhade, Omkar G. ; Degertekin, F. Levent ; Kurfess, Thomas R.
Author_Institution :
Assembly & Test Technol. Dev., Intel Corp., Chandler, AZ, USA
Volume :
15
Issue :
1
fYear :
2010
Firstpage :
1
Lastpage :
8
Abstract :
Active control of phase-sensitive interferometric metrology systems is necessary for low noise, high resolution, high bandwidth, and parallel operation. Conventional active control methods have several drawbacks like low SNR, high complexity, and low bandwidth. With the development of micromachined scanning grating interferometers ( muSGIs), high-bandwidth parallel active control of an array of interferometers is feasible. This paper introduces a novel ldquorecurrent-calibration-based active control algorithm.rdquo Utilizing the high-bandwidth integrated electrostatic actuator, this algorithm splits the calibration of the optics and the displacement measurement in time to achieve better noise reduction. The novel algorithm is implemented digitally using a field-programmable gate array on an array of muSGIs simultaneously. Nonlinearity and the limited range of actuation of the electrostatic actuator affect the performance of the active control. It is compensated by using a lookup table and a gain reversal algorithm. A system model is built to design and analyze the control algorithm. A muSGI interferometer setup validates the model and control approach. The control algorithm reduces the vibration noise by 40 dB at low frequencies with a cutoff frequency of 6.5 kHz. The resolution of the muSGI coupled with the control system is measured as 1 times 10-4 nmrms/radic(Hz) .
Keywords :
electrostatic actuators; field programmable gate arrays; interferometers; measurement; active control; displacement measurement; field-programmable gate array; high-bandwidth integrated electrostatic actuator; low-noise parallel operation; microinterferometers; micromachined scanning grating interferometers; noise reduction; optics; phase-sensitive interferometric metrology systems; Active control; array operation; interferometer; metrology;
fLanguage :
English
Journal_Title :
Mechatronics, IEEE/ASME Transactions on
Publisher :
ieee
ISSN :
1083-4435
Type :
jour
DOI :
10.1109/TMECH.2009.2011897
Filename :
4806080
Link To Document :
بازگشت