Direct Computation of Statistical Variations in Electromagnetic Problems

Author

Ajayi, Ajibola ; Ingrey, Philip ; Sewell, Phillip ; Christopoulos, Christos

Author_Institution

George Green Inst. of Electromagn. Res., Univ. of Nottingham, Nottingham

Volume

50

Issue

2

fYear

2008

fDate

5/1/2008 12:00:00 AM

Firstpage

325

Lastpage

332

Abstract

This paper presents a computationally efficient approach to performing electromagnetic simulations in the presence of statistically defined uncertainties caused by either material in- homogeneities, or fabrication and placement tolerances. Comparisons are made with results from Monte Carlo simulations and a sequence of higher order approximation extensions to the technique. It is shown that accurate results are possible within practical computational limits for the case of small parameter variations.

Keywords

Monte Carlo methods; computational electromagnetics; sequences; Monte Carlo simulation; electromagnetic simulation; higher order approximation; sequences; statistical variation; Computational modeling; Electromagnetic compatibility; Fabrication; Monte Carlo methods; Predictive models; Rough surfaces; Solid modeling; Statistical analysis; Transmission line matrix methods; Uncertainty; Monte Carlo methods; statistical methods; transmission line matrix (TLM) methods;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2008.921039

Filename

4505430