• DocumentCode
    1207133
  • Title

    Design and Characterization of High-Voltage Silicon Carbide Emitter Turn-off Thyristor

  • Author

    Wang, Jun ; Huang, Alex Q.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
  • Volume
    24
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1189
  • Lastpage
    1197
  • Abstract
    A novel MOS-controlled silicon carbide (SiC) thyristor device, the SiC emitter turn-off thyristor (ETO), as a promising technology for future high-voltage and high-frequency switching applications has been developed. The world´s first 4.5-kV SiC p-type ETO prototype based on a 0.36 cm2 SiC p-type gate turn-off (GTO) shows a forward voltage drop of 4.6 V at a current density of 25 A/cm2 and a turn-off energy loss of 9.88 mJ. The low loss shows that the SiC ETO could operate at a 4-kHz frequency with a conventional thermal management system. This frequency capability is about four times higher than the 4.5-kV-class silicon power devices. The numerical simulations and theoretical analysis have been carried out to show the potentially improved performance of the high-voltage SiC ETOs. The results show that the high-voltage (10-kV) SiC n-type ETO has much better tradeoff performance than that of the p-type ETO due to a smaller current gain of the lower bipolar transistor in the SiC n-type GTO. Further improvement of the 10-kV SiC n-type ETO can be made with the optimum design of the drift layer carrier lifetime and buffer layer doping concentration of the 10-kV SiC GTO. The theoretical analysis and numerical simulation shows the SiC ETO also has the excellent reverse bias safe operating area. The experimental and theoretical studies show that the SiC ETO is a promising candidate for high-voltage (> 5 kV) power conversion applications.
  • Keywords
    MOS-controlled thyristors; bipolar transistors; buffer layers; carrier lifetime; current density; doping profiles; electric potential; optimisation; prototypes; semiconductor device models; silicon compounds; thermal management (packaging); wide band gap semiconductors; MOS-controlled thyristors; SiC; bipolar transistor; buffer layer doping concentration; current density; design optimization; drift layer carrier lifetime; forward voltage drop; frequency 4 kHz; high-voltage power conversion applications; high-voltage silicon carbide emitter turn-off thyristor; numerical simulation; p-type gate turn-off; p-type turn-off thyristor prototype; reverse bias safe operating area; size 0.36 cm; thermal management system; turn-off energy loss; voltage 1.5 kV; voltage 10 kV; voltage 4.6 V; Buffer; emitter turn-off thyristor (ETO); high voltage; lifetime; loss; reverse bias safe operating area (RBSOA); silicon carbide (SiC);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2009.2013861
  • Filename
    4806085