Title :
Prevention of Boundary Image Sticking in an AC Plasma Display Panel Using a Vacuum Sealing Process
Author :
Park, Choon-Sang ; Tae, Heung-Sik ; Kwon, Young-Kuk ; Heo, Eun Gi ; Lee, Byung-Hak
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu
fDate :
6/1/2008 12:00:00 AM
Abstract :
Boundary image sticking can be inherently prevented in an ac plasma display panel fabricated using a vacuum sealing process. The results indicate that residual impurities, such as nitrogen or oxygen, are essentially related to the production of boundary image sticking. When checking the production of boundary image sticking in a test panel fabricated using a or an flow during the vacuum sealing process, no boundary image sticking appeared in the case of a flow, whereas boundary image sticking was produced with an flow, although the test panel was fabricated using a vacuum sealing process. Consequently, reducing the residual impurity, particularly oxygen, based on a vacuum sealing process can inherently prevent boundary image sticking.
Keywords :
plasma displays; ac plasma display panel; boundary image sticking; particularly oxygen; test panel fabricated; vacuum sealing process; Focusing; Impurities; Ion beams; Nitrogen; Plasma displays; Production; Scanning electron microscopy; Sputtering; Testing; Transportation; $hbox{O}_{2}$ or $hbox{N}_{2}$ flow; 42-in ac plasma display panel (ac-PDP) module; $hbox{O}_{2}$ or $hbox{N}_{2}$ flow; Atmospheric pressure sealing process; MgO hardness; MgO sputtering rate; boundary image sticking; focused ion beam (FIB); impurity gas; nanoindentor; scanning electron microscope (SEM); time-of-flight secondary ion mass spectrometry (TOF-SIMS); vacuum sealing process;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.921986
