Title :
Fast Neutron Induced Current in Semiconductor Diodes Glass Dosimeter
Author_Institution :
Nuclear Reactor Laboratory Cornell University Ithaca, New York
Abstract :
A theory for the current induced in semiconductor diodes by fast neutron radiation is presented. Experimental verification of the theory is given for silicon rectifiers. It is shown that the signals induced by fast neutrons from a fission source are approximately 7% and 0.2% as large as the gamma ray induced signals for silicon and germanium devices respectively.
Keywords :
Atomic measurements; Electrons; Fission reactors; Glass; Ionization; Laboratories; Neutrons; Semiconductor devices; Semiconductor diodes; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS2.1963.4315458
