Characterization and CMRR Modeling of a Carbon-Nanotube Field-Emission Differential Amplifier

Author

Wong, Yong Mui ; Kang, Weng Poo ; Davidson, Jimmy L. ; Kerns, David V. ; Huang, J.H. ; Galloway, Kenneth F.

Author_Institution

Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN

Volume

56

Issue

5

fYear

2009

fDate

5/1/2009 12:00:00 AM

Firstpage

738

Lastpage

743

Abstract

A novel vacuum field-emission differential amplifier (diff-amp) based on carbon-nanotube (CNT) emitters has been developed, modeled, and its ac performance characterized. A dual-mask microfabrication process was employed to achieve a single-chip diff-amp by integrating matched CNT field-emission triodes with built-in split gates and integrated anodes. The identical pair of triode amplifiers was well matched in device characteristics. The measured ac common-mode-rejection ratio (CMRR) of the diff-amp was ~ 50 dB. The proposed CMRR semianalytical model was validated with the experimental data. The successful implementation of the CNT diff-amp demonstrates a new way to achieve high-temperature and radiation-tolerant vacuum integrated circuits.

Keywords

anodes; carbon nanotubes; differential amplifiers; electron field emission; nanotube devices; triodes; vacuum microelectronics; C; CMRR modeling; CNT emitter; ac common-mode-rejection ratio; built-in split gates; carbon nanotube field-emission differential amplifier; dual-mask microfabrication process; integrated anodes; matched CNT field-emission triode; semianalytical model; single-chip diff-amp; vacuum field-emission diff-amp; vacuum integrated circuits; Anodes; Carbon nanotubes; Differential amplifiers; Electron tubes; High speed integrated circuits; Integrated circuit measurements; Logic gates; Microelectronics; Operational amplifiers; Plasma temperature; Carbon nanotube (CNT); differential amplifier (diff-amp); field emission; integrated circuits (ICs);

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2009.2015418

Filename

4806109