• DocumentCode
    1207388
  • Title

    Transient Radiation Effects in Transistors

  • Author

    Carr, E.A.

  • Author_Institution
    Hughes Aircraft Company Ground Systems Group Fullerton, California
  • Volume
    11
  • Issue
    5
  • fYear
    1964
  • Firstpage
    12
  • Lastpage
    23
  • Abstract
    The measurement, analysis and theory of primary photocurrent in transistors are discussed. Techniques for calculating or predicting primary photocurrent from pre-irradiation measurements are developed. For transistors driven into saturation by high-intensity pulses of gamma radiation, a radiation storage time is defined. A method for predicting radiation storage time entirely from non-radiation parameters is developed.
  • Keywords
    Aircraft; Aluminum alloys; Circuit testing; Gamma rays; Ionizing radiation; Nuclear measurements; Nuclear power generation; Photoconductivity; Radiation effects; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS2.1964.4315471
  • Filename
    4315471