DocumentCode
1207388
Title
Transient Radiation Effects in Transistors
Author
Carr, E.A.
Author_Institution
Hughes Aircraft Company Ground Systems Group Fullerton, California
Volume
11
Issue
5
fYear
1964
Firstpage
12
Lastpage
23
Abstract
The measurement, analysis and theory of primary photocurrent in transistors are discussed. Techniques for calculating or predicting primary photocurrent from pre-irradiation measurements are developed. For transistors driven into saturation by high-intensity pulses of gamma radiation, a radiation storage time is defined. A method for predicting radiation storage time entirely from non-radiation parameters is developed.
Keywords
Aircraft; Aluminum alloys; Circuit testing; Gamma rays; Ionizing radiation; Nuclear measurements; Nuclear power generation; Photoconductivity; Radiation effects; Transient analysis;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS2.1964.4315471
Filename
4315471
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