DocumentCode :
1207388
Title :
Transient Radiation Effects in Transistors
Author :
Carr, E.A.
Author_Institution :
Hughes Aircraft Company Ground Systems Group Fullerton, California
Volume :
11
Issue :
5
fYear :
1964
Firstpage :
12
Lastpage :
23
Abstract :
The measurement, analysis and theory of primary photocurrent in transistors are discussed. Techniques for calculating or predicting primary photocurrent from pre-irradiation measurements are developed. For transistors driven into saturation by high-intensity pulses of gamma radiation, a radiation storage time is defined. A method for predicting radiation storage time entirely from non-radiation parameters is developed.
Keywords :
Aircraft; Aluminum alloys; Circuit testing; Gamma rays; Ionizing radiation; Nuclear measurements; Nuclear power generation; Photoconductivity; Radiation effects; Transient analysis;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS2.1964.4315471
Filename :
4315471
Link To Document :
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