Title :
Characterization of a monolithic slot antenna using an electro-optic sampling technique
Author :
Kamogawa, Kenji ; Toyoda, Ichihiko ; Nishikawa, Kenjiro ; Tokumitsu, Tsuneo
Author_Institution :
NTT Transmission Syst. Labs., Kanagawa, Japan
Abstract :
The first electro-optic measurement of a monolithic antenna near-field is presented. A 10-GHz monolithic slot antenna is designed and precisely characterized by Electro-Optic Sampling (EOS). The fringing effect of a shorted slot and the influence of undesirable modes on the antenna´s near field can be measured accurately. Therefore, the EOS technique is very effective for on-wafer measurement and the development of monolithic antennas.<>
Keywords :
antenna testing; electro-optical devices; microwave measurement; slot antennas; 10 GHz; SHF; electro-optic measurement; electro-optic probe tip; electro-optic sampling; fringing effect; monolithic antenna near-field; monolithic slot antenna; on-wafer measurement; shorted slot; Antenna measurements; Dielectric measurements; Earth Observing System; Electrooptical waveguides; Integrated circuit measurements; Probes; Receiving antennas; Sampling methods; Semiconductor device measurement; Slot antennas;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
