DocumentCode :
1207422
Title :
An Analysis of Steady-State Nuclear Radiation Damage of Tunnel Diodes
Author :
Dowdey, J.E. ; Travis, C.M.
Author_Institution :
Physics Department Arlington State College Arlington, Texas
Volume :
11
Issue :
5
fYear :
1964
Firstpage :
55
Lastpage :
59
Abstract :
Eighteen 2.2-ma and four 10-ma P-substrate (N-on-P), and eighteen 2.2-ma and four 10-ma N-substrate (P-on-N) substrate tunnel diodes were irradiated to 1.5 ?? 1016 n/cm2 (E > 0.3 Mev) and 2.2 1010 ergs/gm-(C) to investigate their radiation-resistance. Peak currents were found to remain constant under these exposures while valley currents increased due to the increase in excess current. P-substrate diodes were found to be the more radiation-resistant, degrading about one half as much as the N-substrate units.
Keywords :
Data systems; Degradation; Diodes; Electronic components; Electronic equipment testing; Inductors; Performance evaluation; Reactor instrumentation; Steady-state; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS2.1964.4315475
Filename :
4315475
Link To Document :
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