DocumentCode :
1207475
Title :
Experimental Analysis of Substrate Noise Effect on PLL Performance
Author :
Rhee, Woogeun ; Jenkins, Keith A. ; Liobe, John ; Ainspan, Herschel
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing
Volume :
55
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
638
Lastpage :
642
Abstract :
This paper describes experimental approaches to analyze the effect of the substrate noise on phase-locked loop (PLL) performance. Spectral analysis considering noise transfer functions of the PLL is used to identify the substrate-noise sensitive components of the PLL. Analyzing the sidebands seen in a spectrum analyzer confirms the importance of knowing the PLL loop dynamics and noise transfer functions. It also leads to the conclusion that the PLL blocks other than the VCO can be more sensitive to substrate noise coupling, depending on the substrate noise frequency. Furthermore, the result shows that intermodulation near the reference clock frequency could be a dominant source of generating sidebands in fractional-N PLLs.
Keywords :
phase locked loops; phase noise; voltage-controlled oscillators; VCO; noise transfer functions; phase-locked loop; reference clock frequency; spectral analysis; substrate noise coupling; substrate noise effect; substrate noise frequency; Coupling; fractional- $N$ frequency synthesizer; jitter; phase noise; phase-locked loop (PLL); substrate noise; voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2008.921582
Filename :
4505798
Link To Document :
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