• DocumentCode
    1207496
  • Title

    Frequency-domain reflectometry for on-board testing of aging aircraft wiring

  • Author

    Furse, Cynthia ; Chung, You Chung ; Dangol, Rakesh ; Nielsen, Marc ; Mabey, Glen ; Woodward, Raymond

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
  • Volume
    45
  • Issue
    2
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    306
  • Lastpage
    315
  • Abstract
    Aging aircraft wiring poses a significant safety threat and has been implicated in losses of both military and commercial aircraft. This paper describes the conceptual design and function of a "smart wiring system" based on a low-cost frequency-domain reflectometer (FDR) that can be used to test the integrity of aircraft cables nondestructively on board. This system will enable the pilot or maintainer to test all critical wiring systems prior to flight at the push of a button. The details and test results from the FDR system on realistic aircraft wires are described. The system has a bandwidth of 0.8-1.2 GHz, a range of 4.5 m, and a resolution of 3 cm and can determine the length and terminating impedance of a cable harnesses from measurements at a single end. The system is now being miniaturized to be imbedded in a "connector saver" format for aftermarket installation on common existing platforms.
  • Keywords
    ageing; aircraft testing; military aircraft; nondestructive testing; reflectometry; wiring; 0.8 to 1.2 GHz; 4.5 m; aftermarket installation; aging; aircraft wiring; cable harnesses; commercial aircraft; connector saver; critical wiring systems; frequency-domain reflectometry; military aircraft; nondestructive testing; on-board testing; safety; smart wiring system; terminating impedance; Aging; Air safety; Bandwidth; Cables; Military aircraft; Nondestructive testing; Reflectometry; System testing; Wires; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2003.811305
  • Filename
    1200877