DocumentCode
1207654
Title
Design of Spin-Torque Transfer Magnetoresistive RAM and CAM/TCAM with High Sensing and Search Speed
Author
Xu, Wei ; Zhang, Tong ; Chen, Yiran
Author_Institution
Dept. of Electr., Comput., & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume
18
Issue
1
fYear
2010
Firstpage
66
Lastpage
74
Abstract
With a great scalability potential, nonvolatile magnetoresistive memory with spin-torque transfer (STT) programming has become a topic of great current interest. This paper addresses cell structure design for STT magnetoresistive RAM, content addressable memory (CAM) and ternary CAM (TCAM). We propose a new RAM cell structure design that can realize high speed and reliable sensing operations in the presence of relatively poor magnetoresistive ratio, while maintaining low sensing current through magnetic tunneling junctions (MTJs). We further apply the same basic design principle to develop new cell structures for nonvolatile CAM, and TCAM. The effectiveness of the proposed RAM, CAM and TCAM cell structures has been demonstrated by circuit simulation at 0.18 ??m CMOS technology.
Keywords
CMOS memory circuits; MRAM devices; circuit simulation; content-addressable storage; magnetic tunnelling; spin systems; CMOS technology; TCAM cell structure; cell structure design; circuit simulation; content addressable memory; magnetic tunneling junction; nonvolatile magnetoresistive memory; reliable sensing operation; search speed; size 0.18 mum; spin-torque transfer magnetoresistive RAM; ternary CAM; Content addressable memory (CAM); magnetic tunneling junction (MTJ); magnetoresistive random access memory (MRAM); spin-torque transfer (STT) magnetoresistive memory; ternary CAM (TCAM);
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2007735
Filename
4806136
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