DocumentCode
1207994
Title
A planar-lumped model for coupled microstrip lines and discontinuities
Author
Sabban, Albert ; Gupta, K.C.
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Volume
40
Issue
2
fYear
1992
fDate
2/1/1992 12:00:00 AM
Firstpage
245
Lastpage
252
Abstract
A convenient model for analyzing coupled microstrip line discontinuities is presented. A planar-lumped model similar to the planar waveguide model for single microstrip lines is developed for coupled microstrip lines. Fields underneath the two strips and those fringing at the outer edge are modeled by two equivalent planar waveguides. Electric and magnetic field coupling in the gap region is modeled by a lumped network. The lumped network parameters are evaluated such that [C] and [L] matrices for the model are identical with those for coupled lines. The model is verified by comparing coupler characteristics with those obtained by the conventional coupled line analysis. Just as the planar model of a single microstrip has been used for characterizing microstrip discontinuities, the planar-lumped model developed is used for coupled line discontinuities. Examples given include coupled microstrip sections with chamfered bends located at right angles to single microstrip lines, for which the results are in good agreement with experimental values
Keywords
coupled circuits; lumped parameter networks; strip line components; strip lines; transmission line theory; chamfered bends; coupled microstrip line discontinuities; coupled microstrip lines; coupler characteristics; electric field coupling; equivalent planar waveguides; experimental values; fringing fields; magnetic field coupling; microstrip discontinuities; planar-lumped model; Coupled mode analysis; Coupling circuits; Impedance; Magnetic analysis; Magnetic fields; Microstrip components; Microstrip filters; Planar waveguides; Strips; Transmission line matrix methods;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.120096
Filename
120096
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