DocumentCode
1208374
Title
Performance and modeling of broadband LiNbO3 traveling wave optical intensity modulators
Author
Gopalakrishnan, G.K. ; Burns, William K. ; McElhanon, Robert W. ; Bulmer, Catherine H. ; Greenblatt, Arthur S.
Author_Institution
Maryland Adv. Dev. Lab., Naval Res. Lab., Washington, DC, USA
Volume
12
Issue
10
fYear
1994
fDate
10/1/1994 12:00:00 AM
Firstpage
1807
Lastpage
1819
Abstract
The design, fabrication and characterization of a traveling wave Ti:LiNbO3 Mach-Zehnder interferometric modulator are discussed. The dependence of the velocity match condition on electrode thickness and wall angle is demonstrated experimentally and with finite element calculations. A set of test electrode structures is fabricated to study electrical losses in the modulator electrode. Loss coefficients are assigned to different sections of the device, and dielectric and radiative losses are shown to play an important role at high frequencies. This information is used in conjunction with finite-element calculations to develop accurate models for both the electrical and optical responses. The frequency dependence of the half-wave voltage is measured and shown to be in good agreement with a model
Keywords
electro-optical devices; electrodes; finite element analysis; integrated optics; light interferometry; lithium compounds; optical design techniques; optical losses; optical modulation; optical workshop techniques; titanium; LiNbO3:Ti; Ti:LiNbO3 Mach-Zehnder interferometric modulator; broadband LiNbO3 traveling wave optical intensity modulators; characterization; design; dielectric losses; electrical losses; electrical responses; electrode thickness; fabrication; finite element calculations; finite-element calculations; frequency dependence; half-wave voltage; high frequencies; loss coefficients; modulator electrode; optical responses; radiative losses; test electrode structures; velocity match condition; wall angle; Dielectric devices; Dielectric losses; Electrodes; Fabrication; Finite element methods; Frequency; Optical interferometry; Optical losses; Optical modulation; Testing;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.337494
Filename
337494
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