• DocumentCode
    1208443
  • Title

    Shot noise in resonant tunneling through an interacting quantum dot with intradot spin-flip scattering

  • Author

    Djuric, Ivana ; Dong, Bing ; Cui, Hong-Liang

  • Author_Institution
    Stevens Inst. of Technol., Hoboken, NJ, USA
  • Volume
    4
  • Issue
    1
  • fYear
    2005
  • Firstpage
    71
  • Lastpage
    76
  • Abstract
    We present theoretical investigation of the zero-frequency shot-noise spectra in electron tunneling through an interacting quantum dot connected to two ferromagnetic leads with the possibility of spin-flip scattering between the two spin states by means of the recently developed bias-voltage and temperature-dependent quantum rate equations. For this purpose, a generalization of the traditional generation-recombination approach is made for properly taking into account the coherent superposition of electronic states, i.e., the nondiagonal density matrix elements. Our numerical calculations find that the Fano factor increases with increasing the polarization of the two leads, but decreases with increasing the intradot spin-flip scattering.
  • Keywords
    Coulomb blockade; electron spin polarisation; ferromagnetic materials; numerical analysis; quantum dots; resonant tunnelling; shot noise; spin dynamics; Fano factor; bias voltage; coherent superposition; electron tunneling; electronic states; ferromagnetic leads; interacting quantum dot; intradot spin-flip scattering; nondiagonal density matrix elements; numerical calculations; resonant tunneling; spin states; temperature dependent quantum rate equations; traditional generation-recombination approach; zero frequency shot noise spectra; Charge measurement; Current measurement; Electric variables measurement; Equations; Particle scattering; Quantum dots; Quantum mechanics; Resonant tunneling devices; Single electron devices; US Department of Transportation;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.840157
  • Filename
    1381397