• DocumentCode
    1208529
  • Title

    Microwave absorption/reflection and magneto-transport experiments on high-mobility electron gas

  • Author

    Studenikin, S.A. ; Potemski, M. ; Sachrajda, A.S. ; Hilke, M. ; Pfeiffer, L.N. ; West, K.W.

  • Author_Institution
    Inst. for Microstructural Sci., Nat. Res. Council, Ottawa, Ont., Canada
  • Volume
    4
  • Issue
    1
  • fYear
    2005
  • Firstpage
    124
  • Lastpage
    131
  • Abstract
    We have performed simultaneous measurements of microwave absorption/reflection and magneto-transport characteristics of a high-mobility two-dimensional electrons in GaAs-AlGaAs heterostructure in the regime of microwave-induced resistance oscillations (MIROs). It is shown that the electrodynamic aspect of the problem is important in these experiments. In the absorption experiments, a broad cyclotron resonance line was observed due to a large reflection from the highly conductive electron gas. There were no additional features observed related to absorption at harmonics of the cyclotron resonance. In near-field reflection experiments, a very different oscillation pattern was revealed when compared to MIROs. The oscillation pattern observed in the reflection experiments is probably due to plasma effects occurring in a finite-size sample. The whole microscopic picture of MIROs is more complicated than simply a resonant absorption at harmonics of the cyclotron resonance. Nevertheless, the experimental observations are in good agreement with the model by Ryzhii et al. involving the photo-assisted scattering in the presence of a crossed magnetic field and dc bias. The observed damping factor of MIROs may be attributed to a change in the electron mobility as a function of temperature.
  • Keywords
    III-V semiconductors; aluminium compounds; cyclotron resonance; electrodynamics; electromagnetic wave absorption; electron mobility; gallium arsenide; magnetoresistance; semiconductor heterojunctions; two-dimensional electron gas; GaAs-AlGaAs; GaAs-AlGaAs heterostructure; broad cyclotron resonance line; damping factor; electrodynamics; electron mobility; high mobility electron gas; magneto transport experiments; microwave absorption; microwave induced resistance oscillations; microwave reflection; microwave sensor; near field reflection experiments; oscillation pattern; photoassisted scattering; plasma effects; Cyclotrons; Electrical resistance measurement; Electrodynamics; Electromagnetic wave absorption; Electrons; Magnetic resonance; Microwave measurements; Performance evaluation; Plasmas; Reflection;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.840137
  • Filename
    1381406