DocumentCode :
1208529
Title :
Microwave absorption/reflection and magneto-transport experiments on high-mobility electron gas
Author :
Studenikin, S.A. ; Potemski, M. ; Sachrajda, A.S. ; Hilke, M. ; Pfeiffer, L.N. ; West, K.W.
Author_Institution :
Inst. for Microstructural Sci., Nat. Res. Council, Ottawa, Ont., Canada
Volume :
4
Issue :
1
fYear :
2005
Firstpage :
124
Lastpage :
131
Abstract :
We have performed simultaneous measurements of microwave absorption/reflection and magneto-transport characteristics of a high-mobility two-dimensional electrons in GaAs-AlGaAs heterostructure in the regime of microwave-induced resistance oscillations (MIROs). It is shown that the electrodynamic aspect of the problem is important in these experiments. In the absorption experiments, a broad cyclotron resonance line was observed due to a large reflection from the highly conductive electron gas. There were no additional features observed related to absorption at harmonics of the cyclotron resonance. In near-field reflection experiments, a very different oscillation pattern was revealed when compared to MIROs. The oscillation pattern observed in the reflection experiments is probably due to plasma effects occurring in a finite-size sample. The whole microscopic picture of MIROs is more complicated than simply a resonant absorption at harmonics of the cyclotron resonance. Nevertheless, the experimental observations are in good agreement with the model by Ryzhii et al. involving the photo-assisted scattering in the presence of a crossed magnetic field and dc bias. The observed damping factor of MIROs may be attributed to a change in the electron mobility as a function of temperature.
Keywords :
III-V semiconductors; aluminium compounds; cyclotron resonance; electrodynamics; electromagnetic wave absorption; electron mobility; gallium arsenide; magnetoresistance; semiconductor heterojunctions; two-dimensional electron gas; GaAs-AlGaAs; GaAs-AlGaAs heterostructure; broad cyclotron resonance line; damping factor; electrodynamics; electron mobility; high mobility electron gas; magneto transport experiments; microwave absorption; microwave induced resistance oscillations; microwave reflection; microwave sensor; near field reflection experiments; oscillation pattern; photoassisted scattering; plasma effects; Cyclotrons; Electrical resistance measurement; Electrodynamics; Electromagnetic wave absorption; Electrons; Magnetic resonance; Microwave measurements; Performance evaluation; Plasmas; Reflection;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2004.840137
Filename :
1381406
Link To Document :
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