• DocumentCode
    1208540
  • Title

    Accurate System Voltage and Timing Margin Simulation in High-Speed I/O System Designs

  • Author

    Kyung Suk Oh ; Lambrecht, F. ; Sam Chang ; Qi Lin ; Jihong Ren ; Chuck Yuan ; Zerbe, J. ; Stojanovic, V.

  • Author_Institution
    Rambus, Inc., Los Altos, CA
  • Volume
    31
  • Issue
    4
  • fYear
    2008
  • Firstpage
    722
  • Lastpage
    730
  • Abstract
    Accurate analysis of system timing and voltage margin including deterministic and random jitter is crucial in high-speed I/O system designs. Traditional SPICE-based simulation techniques can precisely simulate various deterministic jitter sources, such as intersymbol interference (ISI) and crosstalk from passive channels. The inclusion of random jitter in SPICE simulations, however, results in long simulation time. Innovative simulation techniques based on a statistical simulation framework have been recently introduced to cosimulate deterministic and random jitter effects efficiently. This paper presents new improvements on this statistical simulation framework. In particular, we introduce an accurate jitter modeling technique which accounts for bounded jitter with arbitrary spectrum in addition to Gaussian jitter. We also present a rigorous approach to model duty cycle distortion (DCD). A number of I/O systems are considered as examples to validate the proposed modeling methodology.
  • Keywords
    SPICE; crosstalk; intersymbol interference; jitter; statistical analysis; Gaussian jitter; SPICE simulations; arbitrary spectrum; deterministic jitter; duty cycle distortion; high-speed I/O system; innovative simulation techniques; intersymbol interference; passive channels; random jitter; statistical simulation framework; system voltage; timing margin simulation; Analytical models; Bit error rate; Crosstalk; Intersymbol interference; Jitter; Sampling methods; System analysis and design; Timing; Transmitters; Voltage; Bit error rate (BER) simulation; high-speed link; jitter modeling; random jitter; statistical analysis; statistical eye; system margin simulation;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2008.923388
  • Filename
    4509472