DocumentCode
1208569
Title
Density drive [electronics IEDM]
Author
Edwards, Chris ; Dempsey, Paul
Volume
4
Issue
1
fYear
2009
Firstpage
46
Lastpage
49
Abstract
CHIPMAKERS VIED for the prize of densest process at the International Electron Device Meeting (IEDM) held in San Francisco in mid-December, using last-minute switches to put forward their best results and demonstrate that even as far as 22nm conventional transistor structures can still work.
fLanguage
English
Journal_Title
Engineering & Technology
Publisher
iet
ISSN
1750-9637
Type
jour
Filename
4806250
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