DocumentCode :
1208569
Title :
Density drive [electronics IEDM]
Author :
Edwards, Chris ; Dempsey, Paul
Volume :
4
Issue :
1
fYear :
2009
Firstpage :
46
Lastpage :
49
Abstract :
CHIPMAKERS VIED for the prize of densest process at the International Electron Device Meeting (IEDM) held in San Francisco in mid-December, using last-minute switches to put forward their best results and demonstrate that even as far as 22nm conventional transistor structures can still work.
fLanguage :
English
Journal_Title :
Engineering & Technology
Publisher :
iet
ISSN :
1750-9637
Type :
jour
Filename :
4806250
Link To Document :
بازگشت