DocumentCode :
1208599
Title :
Vertical single-crystal ZnO nanowires grown on ZnO:Ga/glass templates
Author :
Hsu, Cheng-Liang ; Chang, Shoou-Jinn ; Hung, Hui-Chuan ; Lin, Yan-Ru ; Huang, Chorng-Jye ; Tseng, Yung-Kuan ; Chen, I. Cherng
Author_Institution :
Dept. of Electron. Eng., Ming Chi Univ. of Technol., Taipei, Taiwan
Volume :
4
Issue :
6
fYear :
2005
Firstpage :
649
Lastpage :
654
Abstract :
Vertical single-crystal ZnO nanowires with uniform diameter and uniform length were selectively grown on ZnO:Ga/glass templates at 600°C by a self-catalyzed vapor-liquid-solid process without any metal catalyst. It was found that the ZnO nanowires are grown preferred oriented in the [002] direction with a small X-ray diffraction full-width half-maximum. Photoluminescence, field-emission scanning electron microscopy, and high-resolution transmission electron microscopy measurements also confirmed good crystal quality of our ZnO nanowires. Field emitters using these ZnO nanowires were also fabricated. It was found that threshold field of the fabricated field emitters was 14 V/μm. With an applied electric field of 24 V/μm, it was found that the emission current density was around 0.1 mA/cm2.
Keywords :
II-VI semiconductors; X-ray diffraction; catalysts; current density; field emission electron microscopy; nanotechnology; nanowires; photoluminescence; scanning electron microscopy; semiconductor growth; texture; transmission electron microscopy; vapour deposition; wide band gap semiconductors; zinc compounds; 600 C; X-ray diffraction; ZnO; applied electric field; crystal quality; emission current density; field-emission scanning electron microscopy; full-width half-maximum; high-resolution transmission electron microscopy; nanofabrication; photoluminescence; preferred orientation; self-catalyzed vapor-liquid-solid process; threshold field; vertical single-crystal ZnO nanowires; Glass; Nanoscale devices; Nanowires; Optoelectronic devices; Scanning electron microscopy; Substrates; Temperature; Transmission electron microscopy; X-ray diffraction; Zinc oxide; Field emission; X-ray diffraction (XRD); ZnO nanowires; field-emission scanning electron microscopy (FESEM); glass; high-resolution transmission electron microscopy (HRTEM); photoluminescence (PL); vapor–liquid–solid (VLS) process;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2005.851394
Filename :
1528467
Link To Document :
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