Title :
Method for predicting fT for carbon nanotube FETs
Author :
Castro, Leonardo C. ; John, D.L. ; Pulfrey, D.L. ; Pourfath, Mahdi ; Gehring, Andreas ; Kosina, Hans
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
A method based on a generic small-signal equivalent circuit for field-effect transistors is proposed for predicting the unity-current-gain frequency fT for carbon-nanotube devices. The key to the useful implementation of the method is the rigorous estimation of the values for the components of the equivalent circuit. This is achieved by numerical differentiation of the charges and currents resulting from self-consistent solutions to the equations of Schrodinger and Poisson. Sample results are presented, which show that fT can have a very unusual dependence on the gate-source bias voltage. This behavior is due mainly to the voltage dependence of the transconductance and capacitance in the presence of quasi-bound states in the nanotube.
Keywords :
Poisson equation; SCF calculations; Schrodinger equation; capacitance; carbon nanotubes; electric admittance; equivalent circuits; field effect transistors; nanotechnology; semiconductor devices; C; FETs; Poisson equations; Schrodinger equations; capacitance; carbon nanotube devices; charges; currents; field-effect transistors; gate-source bias voltage; nanotechnology; numerical differentiation; quantum effect semiconductor devices; quantum wires; quasi-bound states; self-consistent solutions; semiconductor device modeling; small-signal equivalent circuit; transconductance; unity-current-gain frequency; Capacitance; Circuit simulation; Computational modeling; Equivalent circuits; FETs; Frequency; MOSFETs; Microelectronics; Transconductance; Voltage; Carbon nanotube transistors; field-effect transistors (FETs); nanotechnology; quantum effect semiconductor devices; quantum wires; semiconductor device modeling; small-signal analysis;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2005.858603