Title :
Analog-digital and digital-analog converters using single-electron and MOS transistors
Author :
Ou, Xiaobin ; Wu, Nan-Jian
Author_Institution :
Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
Abstract :
This paper proposes two kinds of novel single-electron analog-digital conversion (ADC) and digital-analog conversion (DAC) circuits that consist of single-electron transistors (SETs) and metal-oxide-semiconductor (MOS) transistors. The SET/MOS hybrid ADC and DAC circuits possess the merits of the SET circuit and the MOS circuit. We obtain the SPICE macro-modeling code of the SET transistor by studying and fitting the characteristics of the SET with SPICE simulation and Monte Carlo simulation methods. The SPICE macro-modeling code is used for the simulation of the SET/MOS hybrid ADC and DAC circuits. We simulate the performances of the SET/MOS hybrid 3-b ADC and 2-b DAC circuits by using the H-SPICE simulator. The simulation results demonstrate that the hybrid circuits can perform analog-digital and digital-analog data conversion well at room temperature. The hybrid ADC and DAC circuits have advantages as follows: 1) compared with conventional circuits, the architectures of the circuits are simpler; 2) compared with single electron transistor circuits, the circuits have much larger load capability; 3) the power dissipation of the circuits are lower than ωW; 4) the data conversion rate of the circuits can exceed 100 MHz; and 5) the resolution of the ADC and DAC circuits can be increased by the pipeline architectures.
Keywords :
MOSFET; Monte Carlo methods; SPICE; analogue-digital conversion; single electron transistors; 293 to 298 K; Monte Carlo simulation methods; SET/MOS hybrid ADC; SPICE macromodeling code; SPICE simulation; analog-digital converters; circuit architectures; data conversion rate; digital-analog converters; metal-oxide-semiconductor transistors; pipeline architectures; power dissipation; room temperature; single-electron transistors; Analog-digital conversion; Circuit simulation; Data conversion; Digital-analog conversion; MOSFETs; Pipelines; Power dissipation; SPICE; Single electron transistors; Temperature; Analog–digital conversion (ADC); SPICE; circuit; digital–analog conversion (DAC); hybrid; metal–oxide–semiconductor (MOS); single-electron transistor (SET);
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2005.858600