Title :
On the evaluation of scaling of QCA devices in the presence of defects at manufacturing
Author :
Momenzadeh, Mariam ; Huang, Jing ; Tahoori, Mehdi B. ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
In this paper, we evaluate scaling of quantum-dot cellular automata (QCA) devices (majority voter and inverter) in the presence of defects due to process variations in QCA manufacturing. Simulation results using the two engines of QCADesigner are provided and compared to show the defect tolerance of these devices.
Keywords :
cellular automata; nanotechnology; quantum computing; quantum dots; QCA designer; QCA manufacturing; defect tolerance; engines; quantum device defects; quantum simulation; quantum-dot cellular automata device scaling; Chemicals; Circuit testing; Engines; Inverters; Logic devices; Manufacturing automation; Manufacturing processes; Pulp manufacturing; Quantum cellular automata; Quantum dots; Defect tolerance; quantum-dot cellular automata (QCA); scaling;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2005.858611
