Title :
Dual-polarized slot-coupled planar antenna with wide bandwidth
Author :
Gao, Shi-Chang ; Li, Le-Wei ; Leong, Mook-Seng ; Yeo, Tat-Soon
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
fDate :
3/1/2003 12:00:00 AM
Abstract :
A new dual-polarized slot-coupled microstrip patch antenna is presented, which can achieve high-isolation, low cross-polarization levels, a wide bandwidth, and low backward radiation levels. The coupling slot is an H-shaped slot. For wide bandwidth and easy integration with active circuits, it uses slot-coupled stacked microstrip patches. The theoretical analysis is based on the finite-difference time-domain (FDTD) method. First, a parametric study on the input impedance of the antenna with a single input port is presented. Based on the results, a dual-polarized microstrip antenna is designed, fabricated, and then measured. The measured return loss exhibits an impedance bandwidth of over 20.9% and the isolation between two polarization ports is better than 36 dB over the bandwidth. The cross-polarization levels in both E and H planes are better than 22 dB. The front-to-back ratio of the antenna radiation pattern is better than 21 dB. Both theoretical and experimental results of return loss, isolation, and radiation patterns are presented and discussed.
Keywords :
antenna feeds; antenna radiation patterns; broadband antennas; electric impedance; electromagnetic wave polarisation; finite difference time-domain analysis; microstrip antennas; FDTD method; antenna radiation pattern; cross-polarization; dual-polarized antenna; finite-difference time-domain method; front-to-back ratio; impedance bandwidth; input impedance; microstrip antenna; patch antenna; planar antenna; return loss; slot-coupled antenna; wideband antenna; Antenna measurements; Antenna radiation patterns; Bandwidth; Coupling circuits; Finite difference methods; Impedance; Microstrip antennas; Patch antennas; Planar arrays; Time domain analysis;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2003.809842