DocumentCode :
1209258
Title :
A functional approach to efficient fault detection in iterative logic arrays
Author :
Friedman, Arthur D.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., George Washington Univ., Washington, DC, USA
Volume :
43
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
1365
Lastpage :
1375
Abstract :
We consider the problem of fault detection in iterative logic arrays (ILA´s). This problem has been studied by numerous researchers for many years. The results can be succinctly summarized by stating that one dimensional arrays can be effectively analyzed and significant results obtained while the problems associated with arrays of dimension two or greater appear to be intractable (i.e., NP-complete) for general arbitrary ILA´s. However as is the case for many other switching theory problems, general case problems that are intractable, can be readily handled for the special cases defined by functions commonly encountered in practice. We show that arrays of dimension two or greater can be effectively tested for the case when the functions defined by the arrays have inverses. Many specific arithmetic functions satisfy this property. We also show that even for functions which do not satisfy this property, the functional approach simplifies testing problems considerably
Keywords :
fault diagnosis; fault location; logic arrays; logic testing; NP-complete; arithmetic functions; fault detection; functional approach; iterative logic arrays; one dimensional arrays; Arithmetic; Fault detection; Iterative methods; Logic arrays; Logic testing; Multiprocessor interconnection networks;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.338096
Filename :
338096
Link To Document :
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