DocumentCode
1209258
Title
A functional approach to efficient fault detection in iterative logic arrays
Author
Friedman, Arthur D.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., George Washington Univ., Washington, DC, USA
Volume
43
Issue
12
fYear
1994
fDate
12/1/1994 12:00:00 AM
Firstpage
1365
Lastpage
1375
Abstract
We consider the problem of fault detection in iterative logic arrays (ILA´s). This problem has been studied by numerous researchers for many years. The results can be succinctly summarized by stating that one dimensional arrays can be effectively analyzed and significant results obtained while the problems associated with arrays of dimension two or greater appear to be intractable (i.e., NP-complete) for general arbitrary ILA´s. However as is the case for many other switching theory problems, general case problems that are intractable, can be readily handled for the special cases defined by functions commonly encountered in practice. We show that arrays of dimension two or greater can be effectively tested for the case when the functions defined by the arrays have inverses. Many specific arithmetic functions satisfy this property. We also show that even for functions which do not satisfy this property, the functional approach simplifies testing problems considerably
Keywords
fault diagnosis; fault location; logic arrays; logic testing; NP-complete; arithmetic functions; fault detection; functional approach; iterative logic arrays; one dimensional arrays; Arithmetic; Fault detection; Iterative methods; Logic arrays; Logic testing; Multiprocessor interconnection networks;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.338096
Filename
338096
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