• DocumentCode
    1209258
  • Title

    A functional approach to efficient fault detection in iterative logic arrays

  • Author

    Friedman, Arthur D.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., George Washington Univ., Washington, DC, USA
  • Volume
    43
  • Issue
    12
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    1365
  • Lastpage
    1375
  • Abstract
    We consider the problem of fault detection in iterative logic arrays (ILA´s). This problem has been studied by numerous researchers for many years. The results can be succinctly summarized by stating that one dimensional arrays can be effectively analyzed and significant results obtained while the problems associated with arrays of dimension two or greater appear to be intractable (i.e., NP-complete) for general arbitrary ILA´s. However as is the case for many other switching theory problems, general case problems that are intractable, can be readily handled for the special cases defined by functions commonly encountered in practice. We show that arrays of dimension two or greater can be effectively tested for the case when the functions defined by the arrays have inverses. Many specific arithmetic functions satisfy this property. We also show that even for functions which do not satisfy this property, the functional approach simplifies testing problems considerably
  • Keywords
    fault diagnosis; fault location; logic arrays; logic testing; NP-complete; arithmetic functions; fault detection; functional approach; iterative logic arrays; one dimensional arrays; Arithmetic; Fault detection; Iterative methods; Logic arrays; Logic testing; Multiprocessor interconnection networks;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.338096
  • Filename
    338096