Title :
Tight lower bounds on the detection probabilities of single faults at internal signal lines in combinational circuits
Author :
Ali, S.A. ; Redinbo, G.R.
Author_Institution :
Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
fDate :
12/1/1994 12:00:00 AM
Abstract :
A new technique for estimating a tight lower bound of the detection probabilities for single faults at any internal signal line in a combinational circuit for random testing is presented. This lower bound is calculated from the detection probabilities of all single faults at the primary input lines in a linear time. The technique relies on the relationship between the detection probabilities of dominating and dominated faults in the considered combinational circuit
Keywords :
combinational circuits; fault diagnosis; logic testing; combinational circuits; detection probabilities; internal signal lines; random testing; single faults; tight lower bounds; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Modems; Probability; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
