• DocumentCode
    1209343
  • Title

    Nonsaturating Transistor Circuitry for Nanosecond Pulses

  • Author

    Sugarman, Robert M.

  • Author_Institution
    Brookhaven Natl. Lab., Upton, N.Y.
  • Volume
    7
  • Issue
    1
  • fYear
    1960
  • fDate
    3/1/1960 12:00:00 AM
  • Firstpage
    23
  • Lastpage
    28
  • Abstract
    A system is described for pulse testing of transistors in the 10-10 to 10-9 sec range. Based on these measurements, a nanosecond, current switching, multiple coincidence system has been constructed. It is dc coupled and has input pulse limiters and clipping stubs. A ten-nonosecond scaler-discririnator stage is discussed which also employs current switching techniques. One output is scaled for pulse counting; another unscaled output is used to drive coincidence circuitry.
  • Keywords
    Capacitance; Circuit testing; Electron tubes; Impedance; Oscilloscopes; Pulse circuits; Pulse measurements; Pulse modulation; Sampling methods; Switches;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2015
  • Type

    jour

  • DOI
    10.1109/TNS2.1960.4315712
  • Filename
    4315712