DocumentCode :
1209380
Title :
Numerical Simulation of Critical Current Degradation of \\hbox {Nb}_{3}\\hbox {Sn} Strand in CIC Conductor
Author :
Murakami, Haruyuki ; Ishiyama, Atsushi ; Ueda, Hiroshi ; Koizumi, Norikiyo ; Okun, Kiyoshi
Author_Institution :
Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo
Volume :
18
Issue :
2
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1051
Lastpage :
1054
Abstract :
The critical current of the ITER model coil degraded with an increase in the electromagnetic force. Experiments in which a periodic transverse load was artificially applied to a single coil strand showed this degradation. However, since these experiments were carried out under a certain condition, a general relation between the transverse load and the critical current was not obtained. Therefore, we have developed a numerical simulation code to investigate this general relation. The results of the numerical simulations are in good agreement with the experiments. This indicates that our numerical code is valid for the evaluation of the critical current performance of strands in CIC conductor. Next, the general dependence of the critical current degradation on Ta barrier thickness and resistivity of bronze was evaluated by using the developed simulation code. The results of the calculation showed that the Ta barrier thickness affects the critical current characteristics because of the large flexural rigidity of Ta barrier. On the other hand, the resistivity of bronze and the twist pitch of the filament rarely affect the critical current degradation since current transfers between filaments do not occur within the practical resistivity range of bronze.
Keywords :
critical currents; niobium alloys; numerical analysis; superconducting coils; tin alloys; type II superconductors; CIC conductor; ITER model coil; Nb3Sn; barrier thickness; bending strain; bronze resistivity; critical current degradation; electromagnetic force; numerical simulation; periodic transverse load; twist pitch; $hbox{Nb}_{3}hbox{Sn}$ strand; Bending strain; CICC; critical current; degradation; numerical simulation;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2008.921979
Filename :
4510705
Link To Document :
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