DocumentCode :
120940
Title :
Association between psychology and technical education by EEG
Author :
Sahoo, Swaroop ; Mohanty, S. ; Sahoo, Tapaswini
Author_Institution :
KIIT Univ., Bhubaneswar, India
fYear :
2014
fDate :
21-22 Feb. 2014
Firstpage :
1315
Lastpage :
1321
Abstract :
This paper introduces a method of preference analysis based on electroencephalogram (EEG) analysis of prefrontal cortex activity. The proposed method applies the relationship between EEG activity and the Egogram. The EEG senses a single point and records readings by means of a dry-type sensor and a number of electrodes. The EEG analysis adapts the feature mining and the clustering on EEG patterns using a self-organizing map (SOM). EEG activity of the prefrontal cortex displays individual difference. To take the individual difference into account, we construct a feature vector for input modality of the SOM. The input vector for the SOM consists of the extracted EEG feature vector and a human character vector, which is the human character quantified through the ego analysis using psychological testing. In preprocessing, we extract the EEG feature vector by calculating the time average on each frequency band: θ, low- β, and high- β. To prove the effectiveness of the proposed method, we perform experiments using real EEG data. These results show that the accuracy rate of the EEG pattern classification is higher than it was before improvement of the input vector.
Keywords :
data mining; electroencephalography; feature extraction; medical signal processing; neurophysiology; pattern classification; pattern clustering; psychology; self-organising feature maps; EEG activity; EEG analysis; EEG feature vector extraction; EEG pattern classification; EEG patterns; EEG senses; Egogram; SOM; dry-type sensor; ego analysis; electroencephalogram analysis; extracted EEG feature vector; feature clustering; feature mining; frequency band; human character vector; input modality; input vector; preference analysis; prefrontal cortex activity; prefrontal cortex display; psychological testing; psychology; records readings; self-organizing map; technical education; time average; Electrodes; Electroencephalography; Feature extraction; Pattern classification; Support vector machine classification; Testing; Vectors; Egogram; Electroencephalogram; Individual difference; Pattern classification; Preference; Self-organizing map;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advance Computing Conference (IACC), 2014 IEEE International
Conference_Location :
Gurgaon
Print_ISBN :
978-1-4799-2571-1
Type :
conf
DOI :
10.1109/IAdCC.2014.6779517
Filename :
6779517
Link To Document :
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