• DocumentCode
    1209426
  • Title

    Results from an X-band coaxial extended length cavity

  • Author

    Davis, T.J. ; Schächter, L. ; Nation, J.A.

  • Author_Institution
    Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
  • Volume
    22
  • Issue
    5
  • fYear
    1994
  • fDate
    10/1/1994 12:00:00 AM
  • Firstpage
    504
  • Lastpage
    510
  • Abstract
    Experiments and simulations demonstrate high-power microwave generation at 9 GHz in a coaxial geometry. The 9 cm diameter annular electron beam is propagated between inner and outer drift tube conductors, a configuration which increases the beam current and reduces the structure fields from existing high-power sources, Since the TEM mode of the coaxial guide reduces the quality factor of small-gap cavities, especially at high frequency, the interaction is provided by an extended length cavity loaded with dielectric. A single 16 cm cavity generates 200 MW of power from the 400 keV, 7 kA electron beam. Although the cavity can oscillate at a number of resonances, a single mode is selected with 10-30 kW of input power from a magnetron. A coupler samples 25 MW of the power from the interaction region, precisely measured using a single-shot calorimeter. Simulations indicate that the efficiency of the device is limited to 7% by saturation effects, and can be improved by reducing the length of the cavity
  • Keywords
    cavity resonators; digital simulation; microwave generation; 10 to 30 kW; 200 MW; 25 MW; 400 keV; 7 kA; 9 GHz; 9 cm; TEM mode; X-band coaxial extended length cavity; annular electron beam; coaxial geometry; coaxial guide; coupler; drift tube conductors; efficiency; extended length cavity; high-power microwave generation; interaction; magnetron; quality factor; saturation effects; simulation; single mode; single-shot calorimeter; small-gap cavities; Coaxial components; Conductors; Electron beams; Electron tubes; Frequency; Geometry; Microwave generation; Microwave propagation; Q factor; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.338260
  • Filename
    338260