Title :
Calibration of Curie temperatures for LiTaO/sub 3/ single crystals by the LFB ultrasonic material characterization system
Author :
Kushibiki, Juri-ichi ; Ohashi, Yuji ; Mishima, N.
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
fDate :
5/1/2003 12:00:00 AM
Abstract :
The line-focus-beam ultrasonic material characterization (LFB-UMC) system is applied to a standardized comparison and evaluation of the Curie temperatures, T/sub C/, exclusively used in evaluating the chemical compositions of commercial LiTaO/sub 3/ crystals by measuring the velocities of Rayleigh-type leaky surface acoustic waves (LSAWs), V/sub LSAW/. We measured V/sub LSAW/ and T/sub C/ (standardized) under the same T/sub C/ measurement conditions for 36/spl deg/Y X-LiTaO/sub 3/ single-crystal wafers produced by four manufacturers and related the results to the T/sub C/ (individual) measured by the individual manufacturers. The relationships between V/sub LSAW/ and T/sub C/ (individual) varied from one company to another, and a single straight line of the proportional relationship between V/sub LSAW/ and T/sub C/ (standardized) was obtained for all wafers regardless of the manufacturer. These experimental results clarify that the problem associated with T/sub C/ measurements lies in the measurement conditions and the absolute accuracy of the measurement instruments. Measurements of the center frequencies of SH-type surface acoustic wave (SAW) filter devices are compared with V/sub LSAW/ measurements. A method of calibrating T/sub C/ using this ultrasonic system is proposed to establish standardized specifications of SAW-device crystal wafers.
Keywords :
calibration; ferroelectric Curie temperature; ferroelectric materials; lithium compounds; measurement standards; surface acoustic wave filters; surface acoustic waves; temperature measurement; ultrasonic velocity; Curie temperature calibration; LFB ultrasonic material characterization system; LiTaO/sub 3/; LiTaO/sub 3/ single crystals; Rayleigh-type leaky surface acoustic wave velocities; SAW-device crystal wafers; SH-type surface acoustic wave filter devices; X-LiTaO/sub 3/ single-crystal wafers; center frequencies; chemical compositions; line-focus-beam ultrasonic material characterization; measurement conditions; measurement instrument accuracy; standardized specifications; Acoustic measurements; Acoustic waves; Calibration; Composite materials; Crystalline materials; Frequency measurement; Manufacturing; Surface acoustic waves; Temperature; Ultrasonic variables measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2003.1201467