Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Author

Muchaidze, Giorgi ; Koo, Jayong ; Cai, Qing ; Li, Tun ; Han, Lijun ; Martwick, Andrew ; Wang, Kai ; Min, Jin ; Drewniak, James L. ; Pommerenke, David

Author_Institution

Amber Precision Instrum., Santa Clara, CA

Volume

50

Issue

2

fYear

2008

fDate

5/1/2008 12:00:00 AM

Firstpage

268

Lastpage

276

Abstract

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

Keywords

electrostatic discharge; failure analysis; immunity testing; integrated circuits; printed circuits; ESD; failure analysis; immunity analysis methods; integrated circuits; scan maps; susceptibility scanning; system-level electrostatic discharge problems; Degradation; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Failure analysis; Immunity testing; Performance analysis; Printed circuits; System testing; Voltage; Electrostatic discharges (ESDs); immunity; scanning; susceptibility;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2008.921059

Filename

4510843