Title :
Sb-Heterostructure Millimeter-Wave Detectors With Reduced Capacitance and Noise Equivalent Power
Author :
Su, N. ; Rajavel, R. ; Deelman, P. ; Schulman, J.N. ; Fay, P.
Author_Institution :
IBM Semicond. R&D Center, Hopewell Junction, NY
fDate :
6/1/2008 12:00:00 AM
Abstract :
InAs/AlSb/GaSb backward diodes are used for millimeter-wave square-law power detection. A new heterostructure design with low capacitance, low resistance, and high curvature coefficient as compared to previous designs is presented. Voltage sensitivity, which is directly proportional to curvature coefficient, is improved by 31% as compared to prior reports of devices with similar barrier thicknesses. The junction capacitance is also reduced by 24% to 13 . The improved sensitivity and decreased junction capacitance originate from the incorporation of a p-type-doping plane with sheet concentration of in the n-InAs cathode layer. The combination of low resistance (and thus Johnson noise) and high sensitivity results in an estimated noise equivalent power of 0.24 at 94 GHz for a conjugately matched source, whereas the reduced capacitance facilitates wideband matching and increases the detector cutoff frequency. These modified Sb-based detectors have promise for improving the performance of passive millimeter-wave and submillimeter-wave imaging systems.
Keywords :
antimony compounds; capacitance; doping; gallium compounds; indium compounds; millimetre wave detectors; semiconductor counters; InAs-AlSb-GaSb; backward diodes; heterostructure design; heterostructure millimeter-wave detectors; junction capacitance; millimeter-wave square-law power detection; noise equivalent power; p-type-doping plane; passive millimeter-wave imaging systems; reduced capacitance; submillimeter-wave imaging systems; voltage sensitivity; Backward diodes; Sb-heterostructure detectors; millimeter-wave detectors; tunnel diodes;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2008.922986