• DocumentCode
    1210318
  • Title

    A micromachined Pirani gauge with dual heat sinks

  • Author

    Chae, Junseok ; Stark, Brian H. ; Najafi, Khalil

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    28
  • Issue
    4
  • fYear
    2005
  • Firstpage
    619
  • Lastpage
    625
  • Abstract
    This paper reports a micromachined Pirani gauge with dual heat sinks that can be integrated with microelectromechanical systems (MEMS) devices inside a vacuum package to monitor long-term pressure changes and stability inside the package. The Pirani gauge utilizes small gaps (<1 μm) between its heater and two thermal heat sinks to obtain large dynamic range (20 mtorr to 2 torr) and high sensitivity (3.5×105 (K/W)/torr). The gauge is 2×2 mm2 in size, is fabricated using the dissolved wafer process (DWP) on a glass substrate, and utilizes dielectric bridges for signal routing. Measurements show the low end of the dynamic range can be extended by reducing the gap distance between the heater and thermal sinks, which matches well with analytical modeling. This gauge shows an uncertainty of 50 μtorr and a detectable leak rate of 3.1×10-16 cm3/s, assuming a common micropackage volume of 1.6×10-5 cm3, which represents at least four orders of magnitude improvement over traditional leak testing.
  • Keywords
    electron device testing; heat sinks; integrated circuit packaging; micromachining; micromechanical devices; pressure gauges; dissolved wafer process; dual heat sinks; long term pressure monitoring; microelectromechanical systems; micromachined Pirani gauge; vacuum package; Dielectric substrates; Dynamic range; Glass; Heat sinks; Microelectromechanical systems; Micromechanical devices; Monitoring; Packaging; Stability; Vacuum systems; Microelectromechanical systems (MEMS); Packaging; Pirani gauge; pressure sensor;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.858316
  • Filename
    1528645