DocumentCode :
1210318
Title :
A micromachined Pirani gauge with dual heat sinks
Author :
Chae, Junseok ; Stark, Brian H. ; Najafi, Khalil
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume :
28
Issue :
4
fYear :
2005
Firstpage :
619
Lastpage :
625
Abstract :
This paper reports a micromachined Pirani gauge with dual heat sinks that can be integrated with microelectromechanical systems (MEMS) devices inside a vacuum package to monitor long-term pressure changes and stability inside the package. The Pirani gauge utilizes small gaps (<1 μm) between its heater and two thermal heat sinks to obtain large dynamic range (20 mtorr to 2 torr) and high sensitivity (3.5×105 (K/W)/torr). The gauge is 2×2 mm2 in size, is fabricated using the dissolved wafer process (DWP) on a glass substrate, and utilizes dielectric bridges for signal routing. Measurements show the low end of the dynamic range can be extended by reducing the gap distance between the heater and thermal sinks, which matches well with analytical modeling. This gauge shows an uncertainty of 50 μtorr and a detectable leak rate of 3.1×10-16 cm3/s, assuming a common micropackage volume of 1.6×10-5 cm3, which represents at least four orders of magnitude improvement over traditional leak testing.
Keywords :
electron device testing; heat sinks; integrated circuit packaging; micromachining; micromechanical devices; pressure gauges; dissolved wafer process; dual heat sinks; long term pressure monitoring; microelectromechanical systems; micromachined Pirani gauge; vacuum package; Dielectric substrates; Dynamic range; Glass; Heat sinks; Microelectromechanical systems; Micromechanical devices; Monitoring; Packaging; Stability; Vacuum systems; Microelectromechanical systems (MEMS); Packaging; Pirani gauge; pressure sensor;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2005.858316
Filename :
1528645
Link To Document :
بازگشت