DocumentCode

1210492

Title

The Joint Test Action Group

Author

Maunder, Colin

Author_Institution

British Telecom, Research Laboratories, Ipswich, UK

Volume

3

Issue

4

fYear

1986

fDate

8/1/1986 12:00:00 AM

Firstpage

121

Lastpage

122

Keywords

automatic test equipment; integrated circuit testing; IC complexity; IC users; JTAG; Joint Test Action Group; automatic test equipment; surface-mount technology;

fLanguage

English

Journal_Title

Computer-Aided Engineering Journal

Publisher

iet

ISSN

0263-9327

Type

jour

DOI

10.1049/cae.1986.0033

Filename

4806972