Title :
A new technique for on-chip error estimation and reconfiguration of current-steering digital-to-analog converters
Author :
Rafeeque, K. P Sunil ; Vasudevan, Vinita
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol.-Madras, India
Abstract :
In this paper, we propose a reconfigurable current-steering digital-to-analog converter (DAC). The differential nonlinearity error (DNL) of the DAC is estimated on-chip. This is used to reconfigure the switching sequence to get a lower integral nonlinearity error (INL). We propose a novel technique for estimation of DNL based on a step-size measurement. This greatly reduces the linearity and dynamic range requirements of the measuring circuits. A 10-b segmented DAC, along with the associated circuits for DNL estimation and reconfiguration, was designed using 0.35-μm CMOS technology and fabricated through Europractice. The paper includes theoretical analysis, simulation, and experimental results for the proposed technique.
Keywords :
CMOS integrated circuits; built-in self test; current-mode circuits; digital-analogue conversion; errors; nonlinear estimation; 0.35 micron; 10 bit; DNL estimation/reconfiguration; Europractice; built-in self-test; current-steering digital-to-analog converters; differential nonlinearity error; integral nonlinearity error; linearity/dynamic range requirements; measuring circuits; on-chip error estimation; segmented DAC; step-size measurement; switching sequence; Built-in self-test; CMOS technology; Circuit testing; Costs; Digital-analog conversion; Dynamic range; Error analysis; Linearity; Routing; Voltage; Built-in self-test; digital-to-analog converters (DACs); reconfiguration;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.853587